CT Semiconductor provides stress-based reliability qualification and knowledge-based reliability qualification methodologies based on industry standards. These reliability testing techniques includes:
- High Temperature Operating Life Test (HTOL)
- Bias HAST
- unBias-HAST
- Thermal shock
- Preconditioning
- Temperature humidity bias(THB)
- Highly Accelerated Temperature
- Humidity Stress Test (HAST)
- ESD (HBM, CDM and Air Discharge)
- and more.
We can customize the test conditions to meet your products qualification needs.
